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  1. Data Management
  2. DM-15011

implement separate Visit and Chip fitting for photometry

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      2
    • Sprint:
      AP F18-1, AP F18-2
    • Team:
      Alert Production

      Description

      While doing additional testing of DM-14510, I noticed that the astrometry model fit could be thrown off by doing a line search during the initialization DistortionVisit fit step. This reminded me that I haven't implemented the separate "Visit" and "Chip" fitting option for Photometry: it may help things by pushing the toward the global minimum on the first step (as it does in astrometry). It should be very easy to implement.

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              • Assignee:
                Parejkoj John Parejko
                Reporter:
                Parejkoj John Parejko
                Reviewers:
                Krzysztof Findeisen
                Watchers:
                Jim Bosch, John Parejko, John Swinbank, Krzysztof Findeisen
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