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  1. Data Management
  2. DM-16543

Investigate excess edge-pixel detections in HiTS reprocessing

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    • Story Points:
      12
    • Epic Link:
    • Sprint:
      AP F19-1
    • Team:
      Alert Production

      Description

      As identified in DM-13081, the DM-14762 reprocessing of HiTS shows a sharp increase in the number of DIASources along the chip edges. While these are appropriately flagged as EDGE we wish to investigate the origin of the increased detections.

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            mrawls Meredith Rawls added a comment - - edited

            After DM-20435, this has been thoroughly investigated. In sum, most of the edge pixels are masked as one or more of bad, edge, or suspect, and can be easily filtered out. However, the bad pixel masks (defects) do not fully mask the DECam corners and tape bumps, as exhibited in the attached visualization (credit: Yusra AlSayyad). The plot shows all DIASources on all chips stacked of top of each other, and there are a nonzero number of sources in some known bad regions.

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            mrawls Meredith Rawls added a comment - - edited After DM-20435 , this has been thoroughly investigated. In sum, most of the edge pixels are masked as one or more of bad, edge, or suspect, and can be easily filtered out. However, the bad pixel masks (defects) do not fully mask the DECam corners and tape bumps, as exhibited in the attached visualization (credit: Yusra AlSayyad ). The plot shows all DIASources on all chips stacked of top of each other, and there are a nonzero number of sources in some known bad regions.

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              • Assignee:
                mrawls Meredith Rawls
                Reporter:
                ebellm Eric Bellm
                Reviewers:
                Eric Bellm
                Watchers:
                Eric Bellm, Meredith Rawls
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                • Created:
                  Updated:
                  Resolved:

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