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  1. Data Management
  2. DM-16543

Investigate excess edge-pixel detections in HiTS reprocessing

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    Details

    • Story Points:
      12
    • Epic Link:
    • Sprint:
      AP F19-1
    • Team:
      Alert Production

      Description

      As identified in DM-13081, the DM-14762 reprocessing of HiTS shows a sharp increase in the number of DIASources along the chip edges. While these are appropriately flagged as EDGE we wish to investigate the origin of the increased detections.

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          Issue Links

          is triggered by

          Bug - A problem which impairs or prevents the functions of the product. DM-13081 Examine bad-column masking in HiTS

          • Done
          is triggering

          Bug - A problem which impairs or prevents the functions of the product. DM-20458 Enlarge regions masked via defects on DECam ccds

          • To Do
          relates to

          Story - Created by Jira Software - do not edit or delete. Issue type for a user story. DM-18417 Investigate excess DIASource detections due to diffim background modeling

          • Done
          mentioned in

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            mrawls Meredith Rawls added a comment - - edited

            After DM-20435, this has been thoroughly investigated. In sum, most of the edge pixels are masked as one or more of bad, edge, or suspect, and can be easily filtered out. However, the bad pixel masks (defects) do not fully mask the DECam corners and tape bumps, as exhibited in the attached visualization (credit: Yusra AlSayyad). The plot shows all DIASources on all chips stacked of top of each other, and there are a nonzero number of sources in some known bad regions.

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            mrawls Meredith Rawls added a comment - - edited After DM-20435 , this has been thoroughly investigated. In sum, most of the edge pixels are masked as one or more of bad, edge, or suspect, and can be easily filtered out. However, the bad pixel masks (defects) do not fully mask the DECam corners and tape bumps, as exhibited in the attached visualization (credit: Yusra AlSayyad ). The plot shows all DIASources on all chips stacked of top of each other, and there are a nonzero number of sources in some known bad regions.

              People

              Assignee:
              mrawls Meredith Rawls
              Reporter:
              ebellm Eric Bellm
              Reviewers:
              Eric Bellm
              Watchers:
              Eric Bellm, Meredith Rawls
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                Updated:
                Resolved: