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  1. Data Management
  2. DM-20458

Enlarge regions masked via defects on DECam ccds

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    Details

    • Type: Bug
    • Status: To Do
    • Resolution: Unresolved
    • Fix Version/s: None
    • Component/s: obs_decam
    • Labels:
      None

      Description

      Update DECam defects (bad pixel masks) to include larger edge, corner, and tape bump regions. Presently, the edge and bad pixel masks do not include a large enough region. The suspect pixel mask gets most of the ones missed by edge and bad, but still misses part of the tape bump regions.

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          is triggered by

          Story - Created by Jira Software - do not edit or delete. Issue type for a user story. DM-16543 Investigate excess edge-pixel detections in HiTS reprocessing

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            mrawls Meredith Rawls added a comment - - edited

            The attached plots of DIASources have blue dots for unfledged sources and red dots for flagged sources. They show that lots of bad sources near multiple chip edges/corners/tape bumps are *not* masked by edge or bad, but most (not all) are masked by suspect. 

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            mrawls Meredith Rawls added a comment - - edited The attached plots of DIASources have blue dots for unfledged sources and red dots for flagged sources. They show that lots of bad sources near multiple chip edges/corners/tape bumps are * not * masked by edge or bad, but most (not all) are masked by suspect. 

              People

              Assignee:
              Unassigned Unassigned
              Reporter:
              mrawls Meredith Rawls
              Watchers:
              Eric Bellm, Gabor Kovacs, John Swinbank, Meredith Rawls, Simon Krughoff, Yusra AlSayyad
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                Dates

                Created:
                Updated: